Updated on 2026/06/16

写真a

 
NAGATA TAKAHIRO
 
Organization
Graduate School Graduate School of Science and Technology Visiting Professor
Title
Visiting Professor
External link

Degree

  • 博士(工学) ( 大阪府立大学 )

Research Interests

  • 電子・電気材料

  • 金属

  • 電気・電子材料(半導体、誘電体、磁性体、超誘電体、有機物、絶縁体、超伝導体など)

  • 半導体界面

  • ワイドバンドギャップ半導体

  • ワイドバンドギャップ

  • センサー

  • 半導体物性

Research Areas

  • Nanotechnology/Materials / Composite materials and interfaces

  • Manufacturing technology (mechanical,electrical/electronic, chemical engineering) / Electric/electronic material engineering

  • Nanotechnology/Materials / Inorganic materials

Education

  • Osaka Prefecture University   Doctor of Engineering   Design and Synthesis of Advanced Materials

    2000.4 - 2003.3

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  • Osaka Prefecture University   Master of Engineering   Design and Synthesis of Advanced Materials

    1998.4 - 2000.3

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  • Osaka Prefecture University   Engineering

    1994.4 - 1998.3

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Research History

  • National Institute for Materials Science   Nano Electronics Device Materials Group, Research Center for Electronic and Optical Materials   Group leader

    2023.4

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  • National Cheng Kung University, Taiwan   Department of Materials Science and Engineering   part-time lecturer

    2020.2 - 2020.7

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    Country/Region:Taiwan, Province of China

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  • Meiji University   Visiting Professor

    2018.4

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  • National Institute for Materials Science   Research Center for Electronic and Optical Materials, Nano Electronics Device Materials Group   group leader

    2018.4 - 2023.3

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  • Chiba University

    2016.4 - 2016.9

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  • 科学技術振興機構   戦略的創造研究推進事業   さきがけ研究者

    2014.10 - 2018.3

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  • National Institute for Materials Science   senior researcher

    2011.4 - 2018.3

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  • 物質・材料研究機構   半導体材料センター半導体デバイス材料開発グループ   主任研究員

    2010.4 - 2011.3

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  • University of Carifornia, Santa Barbara   Engineering   guest scientist

    2008.7 - 2009.11

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  • National Institute for Materials Science   Researcher

    2006.4 - 2010.3

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  • National Institute for Materials Science   postdoctoral researcher

    2005.4 - 2006.3

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  • Japan Science Technorogy Agency   CREST   postdoctoral researcher

    2003.4 - 2005.3

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Professional Memberships

  • THE JAPAN SOCIETY OF APPLIED PHYSICS

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Committee Memberships

  • 応用物理学会   電子デバイス界面テクノロジ-研究会 副実行委員長  

    2019.3   

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    Committee type:Academic society

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  •   Compound Semiconductor Week 2019プログラム委員  

    2018.9   

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    Committee type:Academic society

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  • 応用物理学会   第24回電子デバイス界面テクノロジ-研究会 実行委員長  

    2018.4 - 2019.3   

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    Committee type:Academic society

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  • 応用物理学会   第23回電子デバイス界面テクノロジ-研究会プログラム委員長  

    2017.4 - 2018.3   

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    Committee type:Academic society

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  • The International Conference on the Science and Technology for Advanced Ceramics (STAC)   プログラム委員  

    2017.1   

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    Committee type:Academic society

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  • International Conference on Solid State Devices and Materials (SSDM)   Area8 chair  

    2016.1 - 2017.12   

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    Committee type:Academic society

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  • 応用物理学会   電子デバイス界面テクノロジー研究会プログラム委員  

    2015.4   

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    Committee type:Academic society

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  • 応用物理学会   ゲートスタック研究会 ―材料・プロセス・評価の物理―  

    2014.4 - 2015.3   

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    Committee type:Academic society

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  • International Conference on Solid State Devices and Materials (SSDM)   Area8 vice chair  

    2014.1 - 2015.12   

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    Committee type:Academic society

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  • International Conference on Solid State Devices and Materials (SSDM)   論文委員  

    2011.1 - 2017.12   

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    Committee type:Academic society

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  • 応用物理学会   Japan Journal of Applied Physics 特集号論文委員  

    2011.1 - 2017.12   

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    Committee type:Academic society

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Papers

  • Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface Reviewed International journal

    Takahiro Nagata, Asahiko Matsuda, Takashi Teramoto, Dominic Gerlach, Peng Shen, Shigenori Ueda, Takako Kimura, Christian Dussarrat, Toyohiro Chikyow

    Journal of Applied Physics   137 ( 9 )   095304   2025.3

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1063/5.0224068

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  • NF3 and F2 gas fluorination of GaN surface and Pt/GaN interface analyzed by hard X-ray photoelectron spectroscopy

    Asahiko Matsuda, Takashi Teramoto, Takahiro Nagata, Dominic Gerlach, Peng Shen, Shigenori Ueda, Takako Kimura, Christian Dussarrat, Toyohiro Chikyow

    Applied Surface Science   659   159941 - 159941   2024.6

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    Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/j.apsusc.2024.159941

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  • Photoelectron Holographic Study for Atomic Site Occupancy for Si Dopants in Si-Doped κ-Ga<sub>2</sub>O<sub>3</sub>(001)

    YUHUA TSAI, Yusuke Hashimoto, ZeXu Sun, Takuya Moriki, Takashi Tadamura, Takahiro NAGATA, Piero Mazzolini, Antonella Parisini, Matteo Bosi, Luca Seravalli, Tomohiro Matsushita, Yoshiyuki YAMASHITA

    Nano Letters   2024.4

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1021/acs.nanolett.4c00482

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  • Effects of oxidant gas for atomic layer deposition on crystal structure and fatigue of ferroelectric HfxZr1−xO2 thin films

    Takashi Onaya, Toshihide Nabatame, Takahiro Nagata, Kazuhito Tsukagoshi, Jiyoung Kim, Chang-Yong Nam, Esther H.R. Tsai, Koji Kita

    Solid-State Electronics   108801 - 108801   2023.10

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    Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/j.sse.2023.108801

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  • Unusual Selective Monitoring of <i>N,N</i>-Dimethylformamide in a Two-Dimensional Material Field-Effect Transistor

    Akito Fukui, Keigo Matsuyama, Hiroaki Onoe, Shun Itai, Hidekazu Ikeno, Shunsuke Hiraoka, Kousei Hiura, Yuh Hijikata, Jenny Pirillo, Takahiro Nagata, Kuniharu Takei, Takeshi Yoshimura, Norifumi Fujimura, Daisuke Kiriya

    ACS Nano   2023.7

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    Publishing type:Research paper (scientific journal)   Publisher:American Chemical Society (ACS)  

    DOI: 10.1021/acsnano.3c03915

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  • Analysis of Iodide Transport on Methyl Ammonium Lead Iodide Perovskite Solar Cell Structure Through Operando Hard X-ray Photoelectron Spectroscopy

    Ibrahima Gueye, Yasuhiro Shirai, Takahiro Nagata, Takashi Tsuchiya, Dhruba B. Khadka, Masatoshi Yanagida, Okkyun Seo, Kenjiro Miyano, Osami Sakata

    Chemistry of Materials   35 ( 5 )   1948 - 1960   2023.2

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    Publishing type:Research paper (scientific journal)   Publisher:American Chemical Society (ACS)  

    DOI: 10.1021/acs.chemmater.2c03162

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  • Role of Interface Reaction Layer between Ferroelectric Hfxzr1−Xo2 Thin Film and Tin Electrode on Endurance Properties

    Takashi Onaya, Toshihide Nabatame, Takahiro Nagata, Kazuhito Tsukagoshi, Jiyoung Kim, Chang-Yong Nam, Esther H. R. Tsai, Koji Kita

    2023

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    Publishing type:Research paper (scientific journal)   Publisher:Elsevier {BV}  

    DOI: 10.2139/ssrn.4437921

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  • Thermodynamic Interpretation of the Meyer-Neldel Rule Explains Temperature Dependence of Ion Diffusion in Silicate Glass

    N. Takamure, X. Sun, T. Nagata, A. Ho-Baillie, N. Fukata, D. R. McKenzie

    Physical Review Letters   129 ( 17 )   2022.10

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1103/PhysRevLett.129.175901

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  • Direct Observation of Atomic Structures and Chemical States of Active and Inactive Dopant Sites in Mg-Doped GaN

    Jingmin Tang, Soichiro Takeuchi, Masaki Tanaka, Hiroto Tomita, Yusuke Hashimoto, Takahiro Nagata, Jun Chen, Takuo Ohkochi, Yoshinori Kotani, Tomohiro Matsushita, Yoshiyuki Yamashita

    ACS Applied Electronic Materials   4 ( 9 )   4719 - 4723   2022.9

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1021/acsaelm.2c00912

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  • Polarity Control of an All-Sputtered Epitaxial GaN/AlN/Al Film on a Si(111) Substrate by Intermediate Oxidization

    Takahiro Nagata, Yuya Suemoto, Yoshihiro Ueoka, Masami Mesuda, Liwen Sang, Toyohiro Chikyow

    ACS Omega   7 ( 23 )   19380 - 19387   2022.6

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1021/acsomega.2c00957

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  • Effect of reactive gas condition on nonpolar AlN film growth on MnS/Si (100) by reactive DC sputtering

    Masaya Morita, Keiji Ishibashi, Kenichiro Takahashi, Shigenori Ueda, Jun Chen, Kota Tatejima, Toyohiro Chikyow, Atsushi Ogura, Takahiro Nagata

    Japanese Journal of Applied Physics   61 ( SC )   2022.5

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.35848/1347-4065/ac4ad7

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  • Operando hard X-ray photoelectron spectroscopy study of buried interface chemistry of Au/InO1.16C0.04/Al2O3/p<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" id="d1e385" altimg="si20.svg"><mml:msup><mml:mrow /><mml:mrow><mml:mo>+</mml:mo></mml:mrow></mml:msup></mml:math>-Si stacks

    Ibrahima Gueye, Riku Kobayashi, Shigenori Ueda, Toshihide Nabatame, Kazuhito Tsukagoshi, Atsushi Ogura, Takahiro Nagata

    Applied Surface Science   593   153272 - 153272   2022.4

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    Publishing type:Research paper (scientific journal)   Publisher:Elsevier BV  

    DOI: 10.1016/j.apsusc.2022.153272

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  • The electrical conductivity of cubic (In<inf>1- x </inf>Ga<inf>x </inf>)<inf>2</inf>O<inf>3</inf>films ( x ≤ 0.18): Native bulk point defects, Sn-doping, and the surface electron accumulation layer

    Alexandra Papadogianni, Takahiro Nagata, Oliver Bierwagen

    Japanese Journal of Applied Physics   61 ( 4 )   2022.4

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.35848/1347-4065/ac4ec7

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  • Molecular beam epitaxy of single-crystalline bixbyite (In1-x Gax)2 O3 films (x≤0.18): Structural properties and consequences of compositional inhomogeneity

    Alexandra Papadogianni, Charlotte Wouters, Robert Schewski, Johannes Feldl, Jonas Lähnemann, Takahiro Nagata, Elias Kluth, Martin Feneberg, Rüdiger Goldhahn, Manfred Ramsteiner, Martin Albrecht, Oliver Bierwagen

    Physical Review Materials   6 ( 3 )   2022.3

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1103/PhysRevMaterials.6.033604

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  • Combinatorial Synthesis and Interface Analysis for Development of High Dielectric Constant Thin Films

    Takahiro Nagata, Somu Kumaragurubaran, Kenichiro Takahashi, Sung Gi Ri, Toyohiro Chikyow

    ECS Transactions   108 ( 2 )   61 - 68   2022

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    Publishing type:Research paper (international conference proceedings)  

    DOI: 10.1149/10802.0061ecst

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  • Erratum: Direct Observation of Atomic Structures and Chemical States of Active and Inactive Dopant Sites in Mg-Doped GaN (ACS Appl. Electron. Mater. (2022) 4 : 9 (4719−4723) DOI: 10.1021/acsaelm.2c00912)

    Jingmin Tang, Soichiro Takeuchi, Masaki Tanaka, Hiroto Tomita, Yusuke Hashimoto, Takahiro Nagata, Jun Chen, Takuo Ohkochi, Yoshinori Kotani, Tomohiro Matsushita, Yoshiyuki Yamashita

    ACS Applied Electronic Materials   4 ( 10 )   5087 - 4723   2022

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1021/acsaelm.2c01304

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  • Bandgap widening and behavior of Raman-active phonon modes of cubic single-crystalline (In,Ga)<inf>2</inf>O<inf>3</inf> alloy films

    Johannes Feldl, Martin Feneberg, Alexandra Papadogianni, Jonas Lähnemann, Takahiro Nagata, Oliver Bierwagen, Rüdiger Goldhahn, Manfred Ramsteiner

    Applied Physics Letters   119 ( 4 )   2021.7

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1063/5.0056532

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  • Evidence-based recommender system for high-entropy alloys

    Minh Quyet Ha, Duong Nguyen Nguyen, Viet Cuong Nguyen, Takahiro Nagata, Toyohiro Chikyow, Hiori Kino, Takashi Miyake, Thierry Denœux, Van Nam Huynh, Hieu Chi Dam

    Nature Computational Science   1 ( 7 )   470 - 478   2021.7

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1038/s43588-021-00097-w

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  • Effects of Zn x Mn1−x S buffer layer on nonpolar AlN growth on Si (100) substrate

    Masaya Morita, Keiji Ishibashi, Kenichiro Takahashi, Toyohiro Chikyow, Atsushi Ogura, Takahiro Nagata

    Japanese Journal of Applied Physics   60 ( SC )   2021.6

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    Publishing type:Research paper (scientific journal)   Publisher:{IOP} Publishing  

    DOI: 10.35848/1347-4065/abf07a

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  • Effects of low temperature buffer layer on all-sputtered epitaxial GaN/AlN film on Si (111) substrate

    Takahiro Nagata, Yuya Suemoto, Yoshihiro Ueoka, Masami Mesuda, Liwen Sang, Toyohiro Chikyow

    Japanese Journal of Applied Physics   60 ( SC )   2021.6

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    DOI: 10.35848/1347-4065/abf07f

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  • Accelerating two-dimensional X-ray diffraction measurement and analysis with density-based clustering for thin films

    Akihiro Yamashita, Takahiro Nagata, Shinjiro Yagyu, Toru Asahi, Toyohiro Chikyow

    Japanese Journal of Applied Physics   60   2021.6

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    DOI: 10.35848/1347-4065/abf2d8

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  • Influence of adsorbed oxygen concentration on characteristics of carbon-doped indium oxide thin-film transistors under bias stress

    Riku Kobayashi, Toshihide Nabatame, Takashi Onaya, Akihiko Ohi, Naoki Ikeda, Takahiro Nagata, Kazuhito Tsukagoshi, Atsushi Ogura

    Japanese Journal of Applied Physics   60 ( SC )   2021.6

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    DOI: 10.35848/1347-4065/abe685

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  • Correlation between ferroelectricity and ferroelectric orthorhombic phase of Hf<inf>x</inf>Zr<inf>1-x</inf>O<inf>2</inf>thin films using synchrotron x-ray analysis

    Takashi Onaya, Toshihide Nabatame, Yong Chan Jung, Heber Hernandez-Arriaga, Jaidah Mohan, Harrison Sejoon Kim, Naomi Sawamoto, Chang Yong Nam, Esther H.R. Tsai, Takahiro Nagata, Jiyoung Kim, Atsushi Ogura

    APL Materials   9 ( 3 )   2021.3

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1063/5.0035848

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  • Comparison of characteristics of thin film transistor with In2O3 and carbon-doped In2O3 channels by atomic layer deposition and post-metallization annealing in O3

    Riku Kobayashi, Toshihide Nabatame, Takashi Onaya, Akihiko Ohi, Naoki Ikeda, Takahiro NAGATA, Kazuhito TSUKAGOSHI, Atsushi Ogura

    Japanese Journal of Applied Physics   60 ( 3 )   2021.1

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    Publishing type:Research paper (scientific journal)   Publisher:IOP Publishing  

    DOI: 10.35848/1347-4065/abde54

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    Other Link: https://iopscience.iop.org/article/10.35848/1347-4065/abde54/pdf

  • Combinatorial Synthesis Applied to the Development of Thin Film Materials for Nanoelectronics

    Takahiro Nagata, Toyohiro Chikyow

    Functional Thin Films Technology   1 - 20   2021.1

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    Publishing type:Part of collection (book)  

    DOI: 10.1201/9781003088080-1

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  • Plasma-assisted molecular beam epitaxy of SnO(001) films: Metastability, hole transport properties, Seebeck coefficient, and effective hole mass

    Melanie Budde, Piero Mazzolini, Johannes Feldl, Christian Golz, Takahiro Nagata, Shigenori Ueda, Georg Hoffmann, Fariba Hatami, W. Ted Masselink, Manfred Ramsteiner, Oliver Bierwagen

    Physical Review Materials   4 ( 12 )   2020.12

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1103/PhysRevMaterials.4.124602

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  • Exploring the First High-Entropy Thin Film Libraries: Composition Spread-Controlled Crystalline Structure

    Thi Xuyen Nguyen, Yen Hsun Su, Jason Hattrick-Simpers, Howie Joress, Takahiro Nagata, Kao Shuo Chang, Suchismita Sarker, Apurva Mehta, Jyh Ming Ting

    ACS Combinatorial Science   22 ( 12 )   858 - 866   2020.12

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1021/acscombsci.0c00159

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  • Improvement in ferroelectricity and breakdown voltage of over 20-nm-thick HfxZr1-xO2/ZrO2 bilayer by atomic layer deposition

    Takashi Onaya, Toshihide Nabatame, Mari Inoue, Yong Chan Jung, Heber Hernandez-Arriaga, Jaidah Mohan, Harrison Sejoon Kim, Naomi Sawamoto, Takahiro Nagata, Jiyoung Kim, Atsushi Ogura

    APPLIED PHYSICS LETTERS   117 ( 23 )   2020.12

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1063/5.0029709

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  • Valence Band Modification of a (Ga<inf>x</inf>In<inf>1-x</inf>)<inf>2</inf>O<inf>3</inf>Solid Solution System Fabricated by Combinatorial Synthesis

    Takahiro Nagata, Takeshi Hoga, Akihiro Yamashita, Toru Asahi, Shinjiro Yagyu, Toyohiro Chikyow

    ACS Combinatorial Science   22 ( 9 )   433 - 439   2020.9

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1021/acscombsci.0c00033

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  • Dual-Heteroatom-Doped Reduced Graphene Oxide Sheets Conjoined CoNi-Based Carbide and Sulfide Nanoparticles for Efficient Oxygen Evolution Reaction. International journal

    Mohamed Barakat Zakaria, Dehua Zheng, Ulf-Peter Apfel, Takahiro Nagata, El-Refaie S Kenawy, Jianjian Lin

    ACS applied materials & interfaces   12 ( 36 )   40186 - 40193   2020.9

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1021/acsami.0c06141

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  • Band alignment at non-polar AlN/MnS interface investigated by hard X-ray photoelectron spectroscopy Reviewed

    Kazunori Kurishima, Kota Tatejima, Yoshiyuki Yamashita, Shigenori Ueda, Keiji Ishibashi, Kenichiro Takahashi, Setsu Suzuki, Atsushi Ogura, Toyohiro Chikyow, Takahiro Nagata

    Japanese Journal of Applied Physics   59 ( SI )   2020.6

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.35848/1347-4065/ab769c

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  • Development of New High-Dielectric Constant Thin Films By Combinatorial Synthesis

    Takahiro Nagata

    ECS Transactions   97 ( 1 )   61 - 66   2020.4

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    Publishing type:Research paper (international conference proceedings)  

    DOI: 10.1149/09701.0061ecst

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  • Improvement of ferroelectricity and fatigue property of thicker HfxZr1−xO2/ZrO2 bi-layer

    T. Onaya, T. Nabatame, M. Inoue, Y. C. Jung, H. Hernandez-Arriaga, J. Mohan, H. S. Kim, N. Sawamoto, T. Nagata, J. Kim, A. Ogura

    ECS Transactions   98 ( 3 )   63 - 70   2020

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    Publishing type:Research paper (international conference proceedings)  

    DOI: 10.1149/09803.0063ecst

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  • Photoelectron spectroscopic study on electronic state of corundum In<inf>2</inf>O<inf>3</inf> epitaxial thin film grown by mist-CVD

    Takahiro Nagata, Tomohiro Yamaguchi, Shigenori Ueda, Wei Yi, Jun Chen, Takuya Kobayashi, Hirokazu Yokoo, Tohru Honda, Yoshiyuki Yamashita, Toyohiro Chikyow

    Japanese Journal of Applied Physics   59 ( SI )   2020

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    Publishing type:Research paper (international conference proceedings)  

    DOI: 10.35848/1347-4065/ab84b2

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  • Temperature and polarity dependence of electrical properties of ZnO film on pyroelectric LiNbO<inf>3</inf> single crystal

    Yasuhara, Y., Kurishima, K., Chikyow, T., Ogura, A., Nagata, T.

    Japanese Journal of Applied Physics   59 ( SI )   2020

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    Publishing type:Research paper (scientific journal)   Publisher:{IOP} Publishing  

    DOI: 10.35848/1347-4065/ab83df

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  • Gold nanoparticles anchored on mesoporous zirconia thin films for efficient catalytic oxidation of carbon monoxide at low temperatures

    Mohamed Barakat Zakaria, Victor Malgras, Takahiro Nagata, Jeonghun Kim, Yoshio Bando, Amanullah Fatehmulla, Abdullah M. Aldhafiri, W. Aslam Farooq, Yohei Jikihara, Tsuruo Nakayama, Yusuke Yamauchi, Jianjian Lin

    Microporous and Mesoporous Materials   288   2019.11

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1016/j.micromeso.2019.05.055

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  • Photoelectroscopic Study of Mn Barrier Layer on SiO<inf>2</inf> for Si Wafer Bonding Process

    Takahiro Nagata, Kazumichi Tsumura, Kenro Nakamura, Kengo Uchida, Jin Kawakita, Toyohiro Chikyow, Kazuyuki Higashi

    IEEE 2019 International 3D Systems Integration Conference, 3DIC 2019   2019.10

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    Publishing type:Research paper (international conference proceedings)  

    DOI: 10.1109/3DIC48104.2019.9058775

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  • Mesostructured HfO2/Al2O3 Composite Thin Films with Reduced Leakage Current for Ion-Conducting Devices

    Mohamed Barakat Zakaria, Takahiro Nagata, Toyohiro Chikyow

    ACS OMEGA   4 ( 12 )   14680 - 14687   2019.9

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1021/acsomega.9b01095

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  • Molecular magnetic thin films made from Ni-Co Prussian blue analogue anchored on silicon wafers

    Mohamed B. Zakaria, Alexei A. Belik, Takahiro Nagata, Toshiaki Takei, Satoshi Tominaka, Toyohiro Chikyow

    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS   486   2019.9

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1016/j.jmmm.2019.165276

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  • Photoelectron spectroscopic study on electronic state and electrical properties of SnO2 single crystals Reviewed

    Nagata Takahiro, Bierwagen Oliver, Galazka Zbigniew, Ueda Shigenori, Imura Masataka, Yamashita Yoshiyuki, Chikyow Toyohiro

    JAPANESE JOURNAL OF APPLIED PHYSICS   58 ( 8 )   2019.8

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.7567/1347-4065/ab2c1e

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  • Spectroscopic observation of the interface states at the SiO<inf>2</inf>/4H-SiC(0001) interface

    Yoshiyuki Yamashita, Takahiro Nagata, Toyohiro Chikyow, Ryu Hasunuma, Kikuo Yamabe

    e-Journal of Surface Science and Nanotechnology   17   56 - 60   2019.7

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    Publishing type:Research paper (scientific journal)  

    DOI: 10.1380/ejssnt.2019.56

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  • Characteristics of Oxide TFT Using Carbon-Doped Ιn2O3 Thin Film Fabricated by Low-Temperature ALD Using Ethylcyclopentadienyl Indium (Ιn-EtCp) and H2O & O3 Reviewed

    Riku Kobayashi, Toshihide Nabatame, Kazunori Kurishima, Takashi Onaya, Akihiko Ohi, Naoki Ikeda, Takahiro Nagata, Kazuhito Tsukagoshi, Atsushi Ogura

    ECS Transactions   92 ( 3 )   3 - 13   2019.7

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    DOI: 10.1149/09203.0003ecst

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  • Photoelectron spectroscopic study of electronic states and surface structure of an in situ cleaved In2O3 (111) single crystal Reviewed

    Nagata Takahiro, Bierwagen Oliver, Galazka Zbigniew, Imura Masataka, Ueda Shigenori, Yamashita Yoshiyuki, Chikyow Toyohiro

    JAPANESE JOURNAL OF APPLIED PHYSICS   58 ( SD )   2019.6

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  • Effects of substrate self-bias and nitrogen flow rate on non-polar AlN film growth by reactive sputtering Reviewed

    Tatejima Kota, Nagata Takahiro, Ishibashi Keiji, Takahashi Kenichiro, Suzuki Setsu, Ogura Atsushi, Chikyow Toyohiro

    JAPANESE JOURNAL OF APPLIED PHYSICS   58 ( SD )   2019.6

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  • Effect of N plasma treatment in Cu/SiO hybrid bonding using ultra-thin manganese film

    Kazumichi Tsumura, Kengo Uchida, Kenro Nakamura, Takahiro Nagata, Kazuyuki Higashi, Akihiro Kojima, Hideki Shibata

    Proceedings of 2019 6th International Workshop on Low Temperature Bonding for 3D Integration, LTB-3D 2019   12   2019.5

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  • Crystal growth of a MnS buffer layer for non-polar AIN on Si (100) deposited by radio frequency magnetron sputtering Reviewed

    Tatejima Kota, Nagata Takahiro, Ishibashi Keiji, Takahashi Kenichiro, Suzuki Setsu, Ogura Atsushi, Chikyow Toyohiro

    JAPANESE JOURNAL OF APPLIED PHYSICS   58 ( SB )   2019.4

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  • Relationship between band-offset, gate leakage current, and interface states density at SiO2/4H-SiC (000-1) interface Reviewed

    Indari Efi Dwi, Yamashita Yoshiyuki, Hasunuma Ryu, Nagata Takahiro, Ueda Shigenori, Yamabe Kikuo

    AIP ADVANCES   9 ( 4 )   2019.4

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  • Suppression of threshold voltage shift on In-Si-O-C Thin-Film Transistor with an Al2O3 Passivation Layer under Negative and Positive Gate-Bias Stress Reviewed

    K.Kurishima, T.Nabatame, T.Onaya, K.Tsukagoshi, A.Ohi, N.Ikeda, T.Nagata, A.Ogura

    2019 Electron Devices Technology and Manufacturing Conference (EDTM)   74 - 76   2019.3

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    DOI: 10.1109/edtm.2019.8731167

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  • Improvement in ferroelectricity of Hf<inf>x</inf>Zr<inf>1-x</inf>O<inf>2</inf> thin films using top- and bottom-ZrO<inf>2</inf> nucleation layers Reviewed

    Onaya, T., Nabatame, T., Sawamoto, N., Ohi, A., Ikeda, N., Nagata, T., Ogura, A.

    APL Materials   7 ( 6 )   2019

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    DOI: 10.1063/1.5096626

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  • Ferroelectricity of Hf<inf>x</inf>Zr<inf>1−x</inf>O<inf>2</inf> thin films fabricated by 300 °C low temperature process with plasma-enhanced atomic layer deposition Reviewed

    Onaya, T., Nabatame, T., Sawamoto, N., Ohi, A., Ikeda, N., Nagata, T., Ogura, A.

    Microelectronic Engineering   215   2019

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  • Study of Sn and Mg doping effects on TiO2/Ge stack structure by combinatorial synthesis Reviewed

    Takahiro Nagata, Yoshihisa Suzuki, Yoshiyuki Yamashita, Atsushi Ogura, Toyohiro Chikyow

    Japanese Journal of Applied Physics   57 ( 4 )   2018.4

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    DOI: 10.7567/JJAP.57.04FJ04

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  • Solid State Devices and Materials FOREWORD Reviewed

    Kageshima Hiroyuki, Hosoi Takuji, Iwamoto Satoshi, Arie Takayuki, Fujino Masahisa, Fukuzaki Yuzo, Harada Syunta, Ikegami Masashi, Iwamuro Noriyuki, Johguchi Koh, Kakushima Kuniyuki, Kanaya Haruichi, Kikuchi Akihiko, Kinoshita Kentaro, Kuroda Rihito, Kurokawa Yasuyoshi, Maehashi Kenzo, Maekawa Keiichi, Makino Toshiharu, Matsushima Toshinori, Miyata Toshitaka, Morioka Hiroshi, Morioka Hiroshi, Murugesan Mariappan, Nagashio Kosuke, Nagata Takahiro, Nakatsuka Osamu, Nishiyama Nobuhiko, Oiwa Akira, Okada Hiroyuki, Ono Teruo, Sakamoto Toshitsugu, Sakata Toshiya, Shirao Mizuki, Sukegawa Kazuo, Suzuki Toshikazu, Suzuki Hidetoshi, Taima Tetsuya, Tanaka Tetsu, Tatsuoka Kohichi, Tawara Takehiko, Tsuda Kunio, Yamamoto Kazuhiko

    JAPANESE JOURNAL OF APPLIED PHYSICS   57 ( 4 )   2018.4

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  • Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam

    荻原俊弥, 長田貴弘, 吉川英樹

    Journal of Surface Analysis   24 ( 3 )   192‐205   2018.3

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  • Surface and bulk electronic structures of unintentionally and Mg-doped In0.7Ga0.3N epilayer by hard X-ray photoelectron spectroscopy Reviewed

    Masataka Imura, Shunsuke Tsuda, Hiroyuki Takeda, Takahiro Nagata, Ryan G. Banal, Hideki Yoshikawa, Anli Yang, Yoshiyuki Yamashita, Keisuke Kobayashi, Yasuo Koide, Tomohiro Yamaguchi, Masamitsu Kaneko, Nao Uematsu, Ke Wang, Tsutomu Araki, Yasushi Nanishi

    Journal of Applied Physics   123 ( 9 )   2018.3

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    DOI: 10.1063/1.5016574

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  • Chemical Synthesis of Multilayered Nanostructured Perovskite Thin Films with Dielectric Features for Electric Capacitors Reviewed

    Mohamed Barakat Zakaria, Takahiro Nagata, Asahiko Matsuda, Yudai Yasuhara, Atsushi Ogura, Md. Shahriar A. Hossain, Motasim Billah, Yusuke Yamauchi, Toyohiro Chikyow

    ACS APPLIED NANO MATERIALS   1 ( 2 )   915 - 921   2018.2

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    DOI: 10.1021/acsanm.7b00310

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  • Ferroelectricity of Hf <inf>x</inf> Zr <inf>1-x</inf> O <inf>2</inf> thin films fabricated using TiN stressor and ZrO <inf>2</inf> nucleation techniques

    T. Onaya, T. Nabatame, N. Sawamoto, K. Kurishima, A. Ohi, N. Ikeda, T. Nagata, A. Ogura

    ECS Transactions   86 ( 6 )   31 - 38   2018.1

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    DOI: 10.1149/08606.0031ecst

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  • Reliability of Al2O3/In-Si-O-C Thin-Film Transistors with an Al2O3 Passivation Layer under Gate-Bias Stress Reviewed

    Kurishima Kazunori, Nabatame Toshihide, Onaya Takashi, Tsukagoshi Kazuhito, Ohi Akihiko, Ikeda Naoki, Nagata Takahiro, Ogura Atsushi

    ECS Transactions   86 ( 11 )   135 - 145   2018

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    DOI: 10.1149/08611.0135ecst

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  • Ferroelectric-assisted gold nanoparticles array for centimeter-scale highly reproducible SERS substrates Reviewed

    Xiaoyan Liu, Minoru Osada, Kenji Kitamura, Takahiro Nagata, Donghui Si

    SCIENTIFIC REPORTS   7   2017.6

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    DOI: 10.1038/s41598-017-03301-y

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  • Effect of Y and Mn doping into rutile type TiO2/Ge stack structure by combinatorial synthesis Reviewed

    Yoshihisa Suzuki, Takahiro Nagata, Yoshiyuki Yamashita, Toshihide Nabatame, Atsushi Ogura, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS   56 ( 6 )   2017.6

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  • Crystallographic polarity effect of ZnO on thin film growth of pentacene Reviewed

    Tatsuru Nakamura, Takahiro Nagata, Ryoma Hayakawa, Takeshi Yoshimura, Seungjun Oh, Nobuya Hiroshiba, Toyohiro Chikyow, Norifumi Fujimura, Yutaka Wakayama

    JAPANESE JOURNAL OF APPLIED PHYSICS   56 ( 4 )   2017.4

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    DOI: 10.7567/JJAP.56.04CJ03

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  • Surface and bulk electronic structures of heavily Mg-doped InN epilayer by hard X-ray photoelectron spectroscopy Reviewed

    Masataka Imura, Shunsuke Tsuda, Takahiro Nagata, Ryan G. Banal, Hideki Yoshikawa, Anli Yang, Yoshiyuki Yamashita, Keisuke Kobayashi, Yasuo Koide, Tomohiro Yamaguchi, Masamitsu Kaneko, Nao Uematsu, Ke Wang, Tsutomu Araki, Yasushi Nanishi

    JOURNAL OF APPLIED PHYSICS   121 ( 9 )   2017.3

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  • Photoelectron spectroscopic study on monolayer pentacene thin-film/polar ZnO single-crystal hybrid interface Reviewed

    Takahiro Nagata, Tatsuru Nakamura, Ryoma Hayakawa, Takeshi Yoshimura, Seungjun Oh, Nobuya Hiroshiba, Toyohiro Chikyow, Norifumi Fujimura, Yutaka Wakayama

    APPLIED PHYSICS EXPRESS   10 ( 2 )   2017.2

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    DOI: 10.7567/APEX.10.025702

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  • Photoelectron spectroscopic study of electronic state and surface structure of In2O3 single crystals Reviewed

    Takahiro Nagata, Oliver Bierwagen, Zbigniew Galazka, Masataka Imura, Shigenori Ueda, Hideki Yoshikawa, Yoshiyuki Yamashita, Toyohiro Chikyow

    APPLIED PHYSICS EXPRESS   10 ( 1 )   2017.1

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  • Direct Observation of the Energy Distribution of Interface States at SiO2/4H-SiC Interface: Operando Hard X-ray Photoelectron Spectroscopic Study

    山下良之, 蓮沼隆, 長田貴弘, 知京豊祐

    表面科学   38 ( 7 )   347‐350(J‐STAGE) - 350   2017

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    The energy distribution of the interface states at the SiO<sub>2</sub>/4H-SiC(0001) interface was obtained using operando hard x-ray photoelectron spectroscopy. For the energy distribution, two components exsisted. The sharp and high density interface states were observed near the conduction band minimum (CBM) while uniform interface states were present in the entire SiC band-gap. The uniform interface states in the whole gap were assigned to graphitic carbon clusters at the interface while the sharp interface states near CBM could not be clarified in the present study.

    DOI: 10.1380/jsssj.38.347

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  • Contacting ZnO Individual Crystal Facets by Direct Write Lithography Reviewed

    Nikolay Petkov, Janos Volk, Robert Erdelyi, Istvan Endre Lukacs, Takahiro Nagata, Chris Sturm, M. Grundmann

    ACS APPLIED MATERIALS & INTERFACES   8 ( 36 )   23891 - 23898   2016.9

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  • Bottom-electrode effect on switching behavior and interface reaction in nanoionic-based resistive changing memory Reviewed

    Takahiro Nagata, Yoshiyuki Yamashita, Hideki Yoshikawa, Masataka Imura, Seungjun Oh, Kazuyoshi Kobashi, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS   55 ( 8 )   2016.8

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  • Interface stability of electrode/Bi-containing relaxor ferroelectric oxide for high-temperature operational capacitor Reviewed

    Takahiro Nagata, Somu Kumaragurubaran, Yoshifumi Tsunekawa, Yoshiyuki Yamashita, Shigenori Ueda, Kenichiro Takahashi, Sung-Gi Ri, Setsu Suzuki, Seungjun Oh, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS   55 ( 6 )   2016.6

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    DOI: 10.7567/JJAP.55.06GJ12

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  • Thin-film growth of (110) rutile TiO2 on (100) Ge substrate by pulsed laser deposition Reviewed

    Yoshihisa Suzuki, Takahiro Nagata, Yoshiyuki Yamashita, Toshihide Nabatame, Atsushi Ogura, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS   55 ( 6 )   2016.6

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    DOI: 10.7567/JJAP.55.06GG06

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  • Screening charge localization at LiNbO3 surface with Schottky junction Reviewed

    Takahiro Nagata, Toyohiro Chikyow, Kenji Kitamura

    APPLIED PHYSICS LETTERS   108 ( 17 )   2016.4

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    DOI: 10.1063/1.4947578

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  • Interfacial charge transfer behavior of conducting polymers as contact electrode for semiconductor devices Reviewed

    Jin Kawakita, Yuki Fujikawa, Takahiro Nagata, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS   55 ( 4 )   2016.4

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    DOI: 10.7567/JJAP.55.04EC10

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  • Arbitrary cross-section SEM-cathodoluminescence imaging of growth sectors and local carrier concentrations within micro-sampled semiconductor nanorods Reviewed

    Kentaro Watanabe, Takahiro Nagata, Seungjun Oh, Yutaka Wakayama, Takashi Sekiguchi, Janos Volk, Yoshiaki Nakamura

    NATURE COMMUNICATIONS   7   2016.2

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    DOI: 10.1038/ncomms10609

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  • Direct Observation of Energy Distribution of Interface States at SiO2/4H-SiC Interface Reviewed

    Y. Yamashita, R. Hasunuma, T. Nagata, T. Chikyow

    GALLIUM NITRIDE AND SILICON CARBIDE POWER TECHNOLOGIES 6   75 ( 12 )   207 - 211   2016

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    DOI: 10.1149/07512.0207ecst

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  • Hard X-ray photoelectron spectroscopic study on high-k dielectrics based resistic random access memory Reviewed

    T. Nagata, Y. Yamashita, H. Yoshikawa, T. Chikyow

    ECS Transactions   75 ( 32 )   39 - 47   2016

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    DOI: 10.1149/07532.0039ecst

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  • Energy distribution of interface states at SiO2/SiC interface obtained from operando photoelectron spectroscopy

    Yamashita Yoshiyuki, Hasunuma Ryo, Nagata Takahiro, Chikyo Toyohiro

    Abstract of annual meeting of the Surface Science of Japan   36   406 - 406   2016

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    DOI: 10.14886/sssj2008.36.0_406

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  • 強誘電体分極・表面電荷を用いたπ電子材料の機能制御と電界効果素子の開発

    長田貴弘, 北村健二

    村田学術振興財団年報   ( 29-2 )   266‐273   2015.12

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  • Epitaxial growth of high dielectric constant lead-free relaxor ferroelectric for high-temperature operational film capacitor Reviewed

    Somu Kumaragurubaran, Takahiro Nagata, Yoshifumi Tsunekawa, Kenichiro Takahashi, Sung-Gi Ri, Setsu Suzuki, Toyohiro Chikyow

    THIN SOLID FILMS   592   29 - 33   2015.10

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    DOI: 10.1016/j.tsf.2015.09.012

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  • Ge incorporated epitaxy of (110) rutile TiO2 on (100) Ge single crystal at low temperature by pulsed laser deposition Reviewed

    Takahiro Nagata, Kazuyoshi Kobashi, Yoshiyuki Yamashita, Hideki Yoshikawa, Chinnamuthu Paulsamy, Yoshihisa Suzuki, Toshihide Nabatame, Atsushi Ogura, Toyohiro Chikyow

    THIN SOLID FILMS   591   105 - 110   2015.9

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    DOI: 10.1016/j.tsf.2015.08.031

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  • Altering properties of cerium oxide thin films by Rh doping Reviewed

    Klara Sevcikova, Vaclav Nehasil, Mykhailo Vorokhta, Stanislav Haviar, Vladimir Matolin, Iva Matolinova, Karel Masek, Igor Pis, Keisuke Kobayashi, Masaaki Kobata, Takahiro Nagata, Yoshitaka Matsushita, Hideki Yoshikawa

    MATERIALS RESEARCH BULLETIN   67   5 - 13   2015.7

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    DOI: 10.1016/j.materresbull.2015.02.059

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  • Heteroepitaxial growth of nonpolar Cu-doped ZnO thin film on MnS-buffered (100) Si substrate Reviewed

    Tatsuru Nakamura, Nam Nguyen, Takahiro Nagata, Kenichiro Takahashi, Sung-Gi Ri, Keiji Ishibashi, Setsu Suzuki, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS   54 ( 6 )   2015.6

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  • Combinatorial synthesis of BaTiO3-Bi( Mg2/3Nb1/3)O-3 thin-films for high-temperature capacitors Reviewed

    Somu Kumaragurubaran, Takahiro Nagata, Kenichiro Takahashi, Sung-Gi Ri, Yoshifumi Tsunekawa, Setsu Suzuki, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS   54 ( 6 )   2015.6

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    DOI: 10.7567/JJAP.54.06FJ02

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  • Bias induced Cu ion migration behavior in resistive change memory structure observed by hard X-ray photoelectron spectroscopy Reviewed

    Takahiro Nagata, Yoshiyuki Yamashita, Hideki Yoshikawa, Masataka Imura, Seungjun Oh, Kazuyoshi Kobashi, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS   54 ( 6 )   2015.6

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    DOI: 10.7567/JJAP.54.06FG01

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  • Combinatorial synthesis of BaTiO

    Kumaragurubaran Somu, Nagata Takahiro, Takahashi Kenichiro, Ri Sung-Gi, Tsunekawa Yoshifumi, Suzuki Setsu, Chikyow Toyohiro

    Jpn. J. Appl. Phys.   54 ( 6 )   06FJ02   2015.4

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    Combinatorial thin-film of (1−x)[BaTiO<inf>3</inf>]–x[Bi(Mg<inf>2/3</inf>Nb<inf>1/3</inf>)O<inf>3</inf>] — (BT–BMN) was grown on Pt/Ti/SiO<inf>2</inf>/Si, using pulse laser deposition (PLD) method, by ablating stoichiometric and Bi-10 wt % enriched targets to optimize the Bi content. X-ray photoelectron spectroscopy analysis revealed a linear Bi composition spread. As-deposited films post-annealed at high-temperatures, under oxygen atmosphere, turned into crystalline state. The crystallinity, characterized by X-ray diffraction, is better towards Bi-enriched region. The dielectric constant showed a strong dependency of Bi composition and saturated over Bi-7 wt %. The scanning nonlinear dielectric microscopic investigation revealed ferroelectric phase distribution is better around Bi-7 wt % region where the measured leakage current is also minimum. Dielectric constant over 240 and dielectric constant stability below 13% (25–400 °C range) were obtained.

    DOI: 10.7567/JJAP.54.06FJ02

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  • BaTiO3 based relaxor ferroelectric epitaxial thin-films for high-temperature operational capacitors Reviewed

    Somu Kumaragurubaran, Takahiro Nagata, Kenichiro Takahashi, Sung-Gi Ri, Yoshifumi Tsunekawa, Setsu Suzuki, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS   54 ( 4 )   2015.4

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    DOI: 10.7567/JJAP.54.04DH02

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  • Band-Gap Deformation Potential and Elasticity Limit of Semiconductor Free-Standing Nanorods Characterized in Situ by Scanning Electron Microscope-Cathodoluminescence Nanospectroscopy Reviewed

    Kentaro Watanabe, Takahiro Nagata, Yutaka Wakayama, Takashi Sekiguchi, Robert Erdelyi, Janos Volk

    ACS NANO   9 ( 3 )   2989 - 3001   2015.3

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    DOI: 10.1021/nn507159u

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  • BaTiO

    Kumaragurubaran Somu, Nagata Takahiro, Takahashi Kenichiro, Ri Sung-Gi, Tsunekawa Yoshifumi, Suzuki Setsu, Chikyow Toyohiro

    Jpn. J. Appl. Phys.   54 ( 4 )   04DH02   2015.1

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    The epitaxial growth of 0.6[BaTiO<inf>3</inf>]–0.4[Bi(Mg<inf>2/3</inf>Nb<inf>1/3</inf>)O<inf>3</inf>] (BT–BMN) relaxor ferroelectric thin-films on (100) Nb doped SrTiO<inf>3</inf>substrates has been achieved and the structure is investigated for high-temperature capacitor applications. The post growth annealing decreases the oxygen vacancy and other defects in BT–BMN films, resulting in the enhancement of dielectric constant. An insertion of intermediate SrRuO<inf>3</inf>layers as an electrode instead of Pt, sandwiching the film, is found to be more effective in enhancing the dielectric constant. A very high dielectric constant exceeding 400 was achieved from high-temperature annealed film and the film showed an excellent dielectric constant stability of below 11% in the temperature range of 80–400 °C. This will enable smaller, high-temperature tolerant, monolithically integrated thin-film capacitors on power semiconductor devices.

    DOI: 10.7567/JJAP.54.04DH02

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  • Resolving lateral and vertical structures by ellipsometry using wavelength range scan Reviewed

    P. Petrik, E. Agocs, J. Volk, I. Lukacs, B. Fodor, P. Kozma, T. Lohner, S. Oh, Y. Wakayama, T. Nagata, M. Fried

    THIN SOLID FILMS   571   579 - 583   2014.11

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    DOI: 10.1016/j.tsf.2014.02.008

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  • Influence of the substrate choice on the L10 phase formation of post-annealed Pt/Fe and Pt/Ag/Fe thin films Reviewed

    I. A. Vladymyrskyi, M. V. Karpets, G. L. Katona, D. L. Beke, S. I. Sidorenko, T. Nagata, T. Nabatame, T. Chikyow, F. Ganss, G. Beddies, M. Albrecht, I. M. Makogon

    Journal of Applied Physics   116 ( 4 )   2014.7

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    DOI: 10.1063/1.4891477

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  • Highly conductive epitaxial ZnO layers deposited by atomic layer deposition Reviewed

    Zs. Baji, Z. Lábadi, Gy. Molnár, B. Pécz, K. Vad, Z. E. Horváth, P. J. Szabó, T. Nagata, J. Volk

    Thin Solid Films   562   485 - 489   2014.7

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    DOI: 10.1016/j.tsf.2014.04.047

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  • Epitaxial growth of nonpolar ZnO and n-ZnO/i-ZnO/p-GaN heterostructure on Si(001) for ultraviolet light emitting diodes Reviewed

    Nam T. Nguyen, Sung-Gi Ri, Takahiro Nagata, Keiji Ishibashi, Kenichiro Takahashi, Yoshifumi Tsunekawa, Setsu Suzuki, Toyohiro Chikyow

    APPLIED PHYSICS EXPRESS   7 ( 6 )   2014.6

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    DOI: 10.7567/APEX.7.062102

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  • ルチル型TiO<sub>2</sub>界面層を用いたHfO<sub>2</sub>/Ge界面構造制御

    小橋和義, 長田貴弘, 生田目俊秀, 山下良之, 小椋厚志, 知京豊裕

    応用物理学会春季学術講演会講演予稿集(CD-ROM)   61st   ROMBUNNO.18P-D8-4   2014.3

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  • Photoelectron spectroscopic study on band alignment of poly(3-hexylthiophene-2,5-diyl)/polar-ZnO heterointerface Reviewed

    Takahiro Nagata, Seungjun Oh, Yoshiyuki Yamashita, Hideki Yoshikawa, Norihiro Ikeno, Keisuke Kobayashi, Toyohiro Chikyow, Yutaka Wakayama

    THIN SOLID FILMS   554   194 - 198   2014.3

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    DOI: 10.1016/j.tsf.2013.08.018

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  • Photoelectron Spectroscopic Study on High-k Dielectrics Based Nanoionics-Type ReRAM Structure under Bias Operation Reviewed

    T. Nagata, Y. Yamashita, H. Yoshikawa, K. Kobayashi, T. Chikyow

    DIELECTRICS FOR NANOSYSTEMS 6: MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING   61 ( 2 )   301 - 310   2014

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    DOI: 10.1149/06102.0301ecst

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  • Tunable and highly reproducible surface-enhanced Raman scattering substrates made from large-scale nanoparticle arrays based on periodically poled LiNbO3 templates Reviewed

    Xiaoyan Liu, Kenji Kitamura, Qiuming Yu, Jiajie Xu, Minoru Osada, Nagata Takahiro, Jiangyu Li, Guozhong Cao

    SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS   14 ( 5 )   2013.10

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    DOI: 10.1088/1468-6996/14/5/055011

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  • Impact of Mg concentration on energy-band-depth profile of Mg-doped InN epilayers analyzed by hard X-ray photoelectron spectroscopy

    M. Imura, S. Tsuda, T. Nagata, H. Takeda, M. Y. Liao, A. L. Yang, Y. Yamashita, H. Yoshikawa, Y. Koide, K. Kobayashi, T. Yamaguchi, M. Kaneko, N. Uematsu, K. Wang, T. Araki, Y. Nanishi

    APPLIED PHYSICS LETTERS   103 ( 16 )   2013.10

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  • Influence of the annealing atmosphere on the structural properties of FePt thin films Reviewed

    I. A. Vladymyrskyi, M. V. Karpets, F. Ganss, G. L. Katona, D. L. Beke, S. I. Sidorenko, T. Nagata, T. Nabatame, T. Chikyow, G. Beddies, M. Albrecht, Iu. M. Makogon

    JOURNAL OF APPLIED PHYSICS   114 ( 16 )   2013.10

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    DOI: 10.1063/1.4827202

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  • Combinatorial synthesis of Cu/(TaxNb1-x) 2O5 stack structure for nanoionics-type ReRAM device Reviewed

    Takahiro Nagata, Masamitsu Haemori, Toyohiro Chikyow

    ACS Combinatorial Science   15 ( 8 )   435 - 438   2013.8

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    DOI: 10.1021/co4000425

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  • Reduction of interfacial SiO2 at HfO2/Si interface with Ta2O5 cap Reviewed

    Kazuyoshi Kobashi, Takahiro Nagata, Atsushi Ogura, Toshihide Nabatame, Toyohiro Chikyow

    JOURNAL OF APPLIED PHYSICS   114 ( 1 )   2013.7

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    DOI: 10.1063/1.4811691

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  • Systematic investigation of surface and bulk electronic structure of undoped In-polar InN epilayers by hard X-ray photoelectron spectroscopy Reviewed

    Masataka Imura, Shunsuke Tsuda, Takahiro Nagata, Hiroyuki Takeda, Meiyong Liao, AnLi Yang, Yoshiyuki Yamashita, Hideki Yoshikawa, Yasuo Koide, Keisuke Kobayashi, Tomohiro Yamaguchi, Masamitsu Kaneko, Nao Uematsu, Tsutomu Araki, Yasushi Nanishi

    JOURNAL OF APPLIED PHYSICS   114 ( 3 )   2013.7

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    DOI: 10.1063/1.4812570

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  • Generalized mechanism of the resistance switching in binary-oxide-based resistive random-access memories Reviewed

    Katsumasa Kamiya, Moon Young Yang, Takahiro Nagata, Seong-Geon Park, Blanka Magyari-Köpe, Toyohiro Chikyow, Keisaku Yamada, Masaaki Niwa, Yoshio Nishi, Kenji Shiraishi

    Physical Review B   87 ( 15 )   2013.4

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    DOI: 10.1103/physrevb.87.155201

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  • Improving the performance of inorganic-organic hybrid photovoltaic devices by uniform ordering of ZnO nanorods and near-atmospheric pressure nitrogen plasma treatment Reviewed

    Seungjun Oh, Takahiro Nagata, Janos Volk, Yutaka Wakayama

    JOURNAL OF APPLIED PHYSICS   113 ( 8 )   2013.2

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    DOI: 10.1063/1.4793283

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  • Photoelectron spectroscopic study of band alignment of polymer/ZnO photovoltaic device structure Reviewed

    T. Nagata, S. Oh, Y. Yamashita, H. Yoshikawa, N. Ikeno, K. Kobayashi, T. Chikyow, Y. Wakayama

    APPLIED PHYSICS LETTERS   102 ( 4 )   2013.1

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    DOI: 10.1063/1.4790298

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  • Effect of near atmospheric pressure nitrogen plasma treatment on Pt/ZnO interface Reviewed

    Takahiro Nagata, Yoshiyuki Yamashita, Hideki Yoshikawa, Tsuyoshi Uehara, Masamitsu Haemori, Keisuke Kobayashi, Toyohiro Chikyow

    JOURNAL OF APPLIED PHYSICS   112 ( 11 )   2012.12

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    DOI: 10.1063/1.4768908

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  • Hard x-ray photoelectron spectroscopy study on band alignment at poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)/ZnO interface Reviewed

    T. Nagata, S. Oh, Y. Yamashita, H. Yoshikawa, R. Hayakawa, K. Kobayashi, T. Chikyow, Y. Wakayama

    APPLIED PHYSICS LETTERS   101 ( 17 )   2012.10

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    DOI: 10.1063/1.4762834

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  • Electron transport in semiconducting SnO2: Intentional bulk donors and acceptors, the interface, and the surface (vol 27, pg 2232, 2012) Reviewed

    Oliver Bierwagen, Takahiro Nagata, Mark E. White, Min-Ying Tsai, James S. Speck

    JOURNAL OF MATERIALS RESEARCH   27 ( 19 )   2578 - 2578   2012.10

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  • Nanoimprint for Fabrication of Highly Ordered Epitaxial ZnO Nanorods on Transparent Conductive Oxide Films Reviewed

    Seungjun Oh, Takahiro Nagata, Janos Volk, Yutaka Wakayama

    APPLIED PHYSICS EXPRESS   5 ( 9 )   2012.9

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    DOI: 10.1143/APEX.5.095003

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  • Electron transport in semiconducting SnO2: Intentional bulk donors and acceptors, the interface, and the surface Reviewed

    Oliver Bierwagen, Takahiro Nagata, Mark E. White, Min-Ying Tsai, James S. Speck

    JOURNAL OF MATERIALS RESEARCH   27 ( 17 )   2232 - 2236   2012.9

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    DOI: 10.1557/jmr.2012.172

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  • Development of AlN/diamond heterojunction field effect transistors Reviewed

    Masataka Imura, Ryoma Hayakawa, Hirotaka Ohsato, Eiichiro Watanabe, Daiju Tsuya, Takahiro Nagata, Meiyong Liao, Yasuo Koide, Jun-ichi Yamamoto, Kazuhito Ban, Motoaki Iwaya, Hiroshi Amano

    DIAMOND AND RELATED MATERIALS   24   206 - 209   2012.4

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  • Observation of filament formation process of Cu/HfO2/Pt ReRAM structure by hard x-ray photoelectron spectroscopy under bias operation Reviewed

    Takahiro Nagata, Masamitsu Haemori, Yoshiyuki Yamashita, Hideki Yoshikawa, Keisuke Kobayashi, Toyohiro Chikyow

    JOURNAL OF MATERIALS RESEARCH   27 ( 6 )   869 - 878   2012.3

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  • Electrical properties and stability of an epitaxial alumina film formed on Cu-9 at. % Al(111) Reviewed

    Michiko Yoshitake, Takahiro Nagata, Weijie Song

    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A   30 ( 2 )   2012.2

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  • Hard X-ray photoemission spectroscopy on band alignment at PEDOT:PSS/ZnO interface Reviewed

    T. Nagata, S. Oh, Y. Yamashita, H. Yoshikawa, R. Hayakawa, K. Kobayashi, T. Chikyow, Y. Wakayama

    Appl. Phys. Lett.   101   173303-1-4 - 173303-1-4   2012

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  • Bias application hard x-ray photoelectron spectroscopy study of forming process of Cu/HfO2/Pt resistive random access memory structure Reviewed

    T. Nagata, M. Haemori, Y. Yamashita, H. Yoshikawa, Y. Iwashita, K. Kobayashi, T. Chikyow

    APPLIED PHYSICS LETTERS   99 ( 22 )   2011.11

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    DOI: 10.1063/1.3664781

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  • XPS and UPS study on band alignment at Pt-Zn-terminated ZnO(0001) interface Reviewed

    Petr Blumentrit, Michiko Yoshitake, Slavomir Nemsak, Taeyoung Kim, Takahiro Nagata

    APPLIED SURFACE SCIENCE   258 ( 2 )   780 - 785   2011.11

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    DOI: 10.1016/j.apsusc.2011.08.095

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  • Bias-application in Hard X-ray Photoelectronic Study for Advanced Materials

    YAMASHITA Yoshiyuki, NAGATA Takahiro, YOSHIKAWA Hideki, CHIKYOW Toyohiro, KOBAYASHI Keisuke

    Hyomen Kagaku   32 ( 6 )   320 - 324   2011.6

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    We have elucidated the electronic states for Ru/SiON/Si(100) and Pt/HfO&lt;Sub&gt;2&lt;/Sub&gt;/Pt structures under device operation by means of bias-application in hard x-ray photoelectron spectroscopy (BA-HXPES). For the Ru/SiON/Si(100) structure, interface electronic states are increased and new states near the conduction band minimum and valence band maximum are formed compared to the case of the Ru/SiO&lt;Sub&gt;2&lt;/Sub&gt;/Si(100) structure. This is because nitrogen atoms at the SiO&lt;Sub&gt;2&lt;/Sub&gt;/Si interface cause bond breaking and weakened the Si-O and Si-Si bonds at the interface. For the Pt/HfO&lt;Sub&gt;2&lt;/Sub&gt;/Pt structure, oxygen atoms migrate to the top electrode under forward bias, forming Pt-O bond at the Pt/HfO&lt;Sub&gt;2&lt;/Sub&gt; interface. Under reverse bias, on the other hand, oxygen and Hf atoms are migrated to the top electrode, resulting in the formation of Pt-O and Pt-Hf bonds at the interface. The migration and bond formation at the interface should form vacancy in the HfO&lt;Sub&gt;2&lt;/Sub&gt; film, which might induce resistance switching behavior in this system. Here, it is emphasized that we present our approach using BA-HXPES, which successfully detects the electronic states under device operation. Therefore BA-HXPES could be applicable to various kinds of advanced materials and will be indispensable for evaluating their physical properties in detail.

    DOI: 10.1380/jsssj.32.320

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  • XPS study of Sb-/In-doping and surface pinning effects on the Fermi level in SnO2 (101) thin films Reviewed

    T. Nagata, O. Bierwagen, M. E. White, M. Y. Tsai, Y. Yamashita, H. Yoshikawa, N. Ohashi, K. Kobayashi, T. Chikyow, J. S. Speck

    APPLIED PHYSICS LETTERS   98 ( 23 )   2011.6

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    DOI: 10.1063/1.3596449

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  • Investigations into the Impact of the Template Layer on ZnO Nanowire Arrays Made Using Low Temperature Wet Chemical Growth Reviewed

    Robert Erdelyi, Takahiro Nagata, David J. Rogers, Ferechteh H. Teherani, Zsolt E. Horvath, Zoltan Labadi, Zsofia Baji, Yutaka Wakayama, Janos Volk

    CRYSTAL GROWTH & DESIGN   11 ( 6 )   2515 - 2519   2011.6

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    DOI: 10.1021/cg2002755

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  • Depletion of the In2O3(001) and (111) surface electron accumulation by an oxygen plasma surface treatment Reviewed

    Oliver Bierwagen, James S. Speck, Takahiro Nagata, Toyohiro Chikyow, Yoshiyuki Yamashita, Hideki Yoshikawa, Keisuke Kobayashi

    APPLIED PHYSICS LETTERS   98 ( 17 )   2011.4

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    DOI: 10.1063/1.3583446

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  • Effect of UV-ozone treatment on electrical properties of PEDOT:PSS film Reviewed

    Takahiro Nagata, Seungjun Oha, Toyohiro Chikyow, Yutaka Wakayama

    ORGANIC ELECTRONICS   12 ( 2 )   279 - 284   2011.2

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    DOI: 10.1016/j.orgel.2010.11.009

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  • 傾斜機能材料の開発と新展開 コンビナトリアル手法を用いたナノエレクトロニクス材料における合金薄膜材料開発

    長田貴弘, 知京豊裕

    金属   81 ( 1 )   32 - 37   2011.1

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  • コンビナトリアル手法を用いたナノエレクトロニクス材料における合金薄膜材料開発 (特集 傾斜機能材料の開発と新展開)

    長田 貴弘, 知京 豊裕

    金属   81 ( 1 )   32 - 37   2011.1

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  • The effect of seed layer crystallinity on the ordered growth of vertically aligned ZnO nanowire arrays Reviewed

    R?bert Erd?lyi, Takahiro Nagata, David J. Rogers, Ferechteh Hosseini Teherani, Zolt?n L?badi, Yutaka Wakayama, J?nos Volk

    Crystal Growth and Design   11   2515 - 2519   2011

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  • New Phases of sp(3)-bonded Boron Nitride Prepared by Photo-Assisted Plasma Processing Methods: The Fundamentals and Applications to Electronic Devices Reviewed

    Shojiro Komatsu, Kazuaki Kobayashi, Takahiro Nagata, Toyohiro Chikyo

    INTERNATIONAL CONFERENCE ON ADVANCES IN CONDENSED AND NANO MATERIALS (ICACNM-2011)   1393   2011

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    DOI: 10.1063/1.3653601

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  • XPS study on band alignment at Pt-O-terminated ZnO(000(1)over-bar) interface Reviewed

    Taeyoung Kim, Michiko Yoshitake, Shinjiro Yagyu, Slavomir Nemsak, Takahiro Nagata, Toyohiro Chikyow

    SURFACE AND INTERFACE ANALYSIS   42 ( 10-11 )   1528 - 1531   2010.10

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    DOI: 10.1002/sia.3601

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  • Oxygen migration at Pt/HfO2/Pt interface under bias operation Reviewed

    T. Nagata, M. Haemori, Y. Yamashita, H. Yoshikawa, Y. Iwashita, K. Kobayashi, T. Chikyow

    APPLIED PHYSICS LETTERS   97 ( 8 )   2010.8

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    DOI: 10.1063/1.3483756

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  • Photoinduced Phase Transformations in Boron Nitride: New Polytypic Forms of sp(3)-Bonded (6H-and 30H-) BN Reviewed

    Shojiro Komatsu, Kazuaki Kobayashi, Yuhei Sato, Daisuke Hirano, Takuya Nakamura, Takahiro Nagata, Toyohiro Chikyo, Takayuki Watanabe, Takeo Takizawa, Katsumitsu Nakamura, Takuya Hashimoto

    JOURNAL OF PHYSICAL CHEMISTRY C   114 ( 31 )   13176 - 13186   2010.8

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    DOI: 10.1021/jp1028728

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  • Schottky barrier height behavior of Pt-Ru alloy contacts on single-crystal n-ZnO Reviewed

    T. Nagata, J. Volk, M. Haemori, Y. Yamashita, H. Yoshikawa, R. Hayakawa, M. Yoshitake, S. Ueda, K. Kobayashi, T. Chikyow

    JOURNAL OF APPLIED PHYSICS   107 ( 10 )   2010.5

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    DOI: 10.1063/1.3427562

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  • Study of the Au Schottky contact formation on oxygen plasma treated n-type SnO2 (101) thin films Reviewed

    Takahiro Nagata, Oliver Bierwagen, Mark E. White, Min-Ying Tsai, James S. Speck

    JOURNAL OF APPLIED PHYSICS   107 ( 3 )   2010.2

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    DOI: 10.1063/1.3298467

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  • Sp(3)-bonded new phases of BN; their growth by laser-plasma synchronous processing and applications Reviewed

    Shojiro Komastu, Kazuaki Kobayashi, Takahiro Nagata, Toyohiro Chikyo

    TENCON 2010: 2010 IEEE REGION 10 CONFERENCE   993 - 997   2010

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    DOI: 10.1109/TENCON.2010.5686468

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  • P-type sp(3)-bonded BN/n-type Si heterodiode solar cell fabricated by laser-plasma synchronous CVD method Reviewed

    Shojiro Komatsu, Yuhei Sato, Daisuke Hirano, Takuya Nakamura, Kazunori Koga, Atsushi Yamamoto, Takahiro Nagata, Toyohiro Chikyo, Takayuki Watanabe, Takeo Takizawa, Katsumitsu Nakamura, Takuya Hashimoto, Masaharu Shiratani

    JOURNAL OF PHYSICS D-APPLIED PHYSICS   42 ( 22 )   2009.11

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    DOI: 10.1088/0022-3727/42/22/225107

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  • Non-Alloyed Schottky and Ohmic Contacts to As-Grown and Oxygen-Plasma Treated n-Type SnO2 (110) and (101) Thin Films Reviewed

    Oliver Bierwagen, Mark E. White, Min-Ying Tsai, Takahiro Nagata, James S. Speck

    APPLIED PHYSICS EXPRESS   2 ( 10 )   2009.10

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    DOI: 10.1143/APEX.2.106502

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  • Surface structure and chemical states of a-plane and c-plane InN films Reviewed

    Takahiro Nagata, Gregor Koblmueller, Oliver Bierwagen, Chad S. Gallinat, James S. Speck

    APPLIED PHYSICS LETTERS   95 ( 13 )   2009.9

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    DOI: 10.1063/1.3238286

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  • Highly uniform epitaxial ZnO nanorod arrays for nanopiezotronics Reviewed

    J. Volk, T. Nagata, R. Erdélyi, I. Bársony, A. L. Tóth, I. E. Lukács, Zs. Czigány, H. Tomimoto, Y. Shingaya, T. Chikyow

    Nanoscale Research Letters   4 ( 7 )   699 - 704   2009.7

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    DOI: 10.1007/s11671-009-9302-1

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  • Effect of Annealing on Mechanical Properties of Materials Formed by Focused Au or Si Ion-Beam-Induced Chemical Vapor Deposition Using Phenanthrene Reviewed

    Takuma Yo, Hideaki Tanaka, Takahiro Nagata, Naoki Fukata, Toyohiro Chikyow, Akira Sakai, Junichi Yanagisawa

    JAPANESE JOURNAL OF APPLIED PHYSICS   48 ( 6 )   2009.6

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    DOI: 10.1143/JJAP.48.06FB03

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  • Impact of Cu Electrode on Switching Behavior in a Cu/HfO2/Pt Structure and Resultant Cu Ion Diffusion Reviewed

    Masamitsu Haemori, Takahiro Nagata, Toyohiro Chikyow

    APPLIED PHYSICS EXPRESS   2 ( 6 )   2009.6

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    DOI: 10.1143/APEX.2.061401

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  • Interface structure and the chemical states of Pt film on polar-ZnO single crystal Reviewed

    T. Nagata, J. Volk, Y. Yamashita, H. Yoshikawa, M. Haemori, R. Hayakawa, M. Yoshitake, S. Ueda, K. Kobayashi, T. Chikyow

    APPLIED PHYSICS LETTERS   94 ( 22 )   2009.6

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    DOI: 10.1063/1.3149701

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  • Surface Nitridation of c-Plane Sapphire Substrate by Near-Atmospheric Nitrogen Plasma Reviewed

    Takahiro Nagata, Masamitsu Haemori, Junichiro Anzai, Tsuyoshi Uehara, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS   48 ( 4 )   2009.4

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    DOI: 10.1143/JJAP.48.040206

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  • Prediction of iodide adsorption on oxides by surface complexation modeling with spectroscopic confirmation Reviewed

    Takahiro Nagata, Keisuke Fukushi, Yoshio Takahashi

    JOURNAL OF COLLOID AND INTERFACE SCIENCE   332 ( 2 )   309 - 316   2009.4

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    DOI: 10.1016/j.jcis.2008.12.037

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  • Electronic structure analysis of silicon nanowires for high conductivity in n- and p-channel nanowire-FET Reviewed

    Yeonghun Lee, Takahiro Nagata, Kuniyuki Kakushima, Kenji Shiraishi, Hiroshi Iwai

    ECS Transactions   16 ( 40 )   1 - 5   2009

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    DOI: 10.1149/1.3108347

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  • Hydrogen effect on near-atmospheric nitrogen plasma assisted chemical vapor deposition of GaN film growth Reviewed

    T. Nagata, M. Haemori, Y. Sakuma, T. Chikyow, J. Anzai, T. Uehara

    Journal of Applied Physics   105 ( 6 )   2009

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    DOI: 10.1063/1.3086715

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  • Capability of focused Ar ion beam sputtering for combinatorial synthesis of metal films Reviewed

    T. Nagata, M. Haemori, T. Chikyow

    Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films   27 ( 3 )   492 - 495   2009

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    DOI: 10.1116/1.3097847

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  • Effect of Annealing on Implanted Ga of Diamond-Like Carbon Thin Films Fabricated by Focused-Ion-Beam Chemical Vapor Deposition Reviewed

    Takahiro Nagata, Yoshiki Sakuma, Masamitsu Haemori, Kiyomi Nakajima, Reo Kometani, Kazuhiro Kanda, Shinji Matsui, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS   47 ( 12 )   9010 - 9012   2008.12

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    DOI: 10.1143/JJAP.47.9010

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  • Annealing Effect of Deposited Materials formed byFocused Au Ion Beam-induced Chemical Vapor Deposition using Phenanthrene Reviewed

    T. Yo, H. Tanaka, T. Nagata, N. Fukata, T. Chikyow, A. Sakai, J. Yanagisawa

    Digest of Papers 2008 International Microprocess and Nanotechnology Conference   2008.10

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  • Thermal stability of Ni silicide films on heavily doped n(+) and p(+) Si substrates Reviewed

    Parhat Ahmet, Takashi Shiozawa, Koji Nagahiro, Takahiro Nagata, Kuniyuki Kakushima, Kazuo Tsutsui, Toyohiro Chikyow, Hiroshi Iwai

    MICROELECTRONIC ENGINEERING   85 ( 7 )   1642 - 1646   2008.7

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    Language:English   Publishing type:Research paper (scientific journal)  

    DOI: 10.1016/j.mee.2008.04.001

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  • Characterization of deposited materials formed by focused ion beam-induced chemical vapor deposition using AuSi alloyed metal source Reviewed

    Takuma Yo, Hideaki Tanaka, Kakunen Koreyama, Takahiro Nagata, Yoshiki Sakuma, Kiyomi Nakajima, Toyohiro Chikyow, Junichi Yanagisawa, Akira Sakai

    JAPANESE JOURNAL OF APPLIED PHYSICS   47 ( 6 )   5018 - 5021   2008.6

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    DOI: 10.1143/JJAP.47.5018

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  • Fully engineered homoepitaxial zinc oxide nanopillar array for near-surface light wave manipulation Reviewed

    J. Volk, A. Hakansson, H. T. Miyazaki, T. Nagata, J. Shimizu, T. Chikyow

    APPLIED PHYSICS LETTERS   92 ( 18 )   2008.5

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    DOI: 10.1063/1.2924282

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  • Composition-spread thin films of pentacene and 6,13-pentacenequinone fabricated by using continuous-wave laser molecular beam epitaxy Reviewed

    Seiichiro Yaginuma, Kenji Itaka, Yuji Matsumoto, Tsuyoshi Ohnishi, Mikk Lippmaa, Takahiro Nagata, Toyohiro Chikyow, Hideomi Koinuma

    APPLIED SURFACE SCIENCE   254 ( 8 )   2336 - 2341   2008.2

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    DOI: 10.1016/j.apsusc.2007.09.052

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  • Ni silicidation on Heavily Doped Si Substrates Reviewed

    Parhat Ahmet, Takashi Shiozawa, Koji Nagahiro, Takahiro Nagata, Kuniyuki Kakushima, Kazuo Tsutsui, Toyohiro Chikyow, Hiroshi Iwai

    2008 9TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY, VOLS 1-4   1296 - +   2008

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  • Landscape of combinatorial materials exploration and high throughput characterizations for the post-cmos devices

    T. Chikyow, K. Ohmori, T. Nagata, N. Umezawa, M. Haemori, M. Yoshitake, T. Hasegawa, H. Koinuma, K. Yamada

    International Symposium on VLSI Technology, Systems, and Applications, Proceedings   66 - 67   2008

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    DOI: 10.1109/VTSA.2008.4530801

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  • Crystal structures of Pt-Ru alloy Schottky contacts on ZnO by combinatorial ion beam deposition Reviewed

    Takahiro Nagata, Parhat Ahmet, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS   46 ( 5A )   2907 - 2909   2007.5

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    DOI: 10.1143/JJAP.46.2907

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  • GaN film fabrication by near-atmospheric plasma-assisted chemical vapor deposition Reviewed

    Takahiro Nagata, Yoshiki Sakuma, Tsuyoshi Uehara, Toyohiro Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS   46 ( 1-3 )   L43 - L45   2007.1

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    DOI: 10.1143/JJAP.46.L43

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  • Characterization of deposited materials formed by focused ion beam-induced chemical vapor deposition using an AuSi alloyed metal source Reviewed

    T. Yo, H. Tanaka, K. Koreyama, T. Nagata, Y. Sakuma, K. Nakajima, T. Chikyow, J. Yanagisawa, A. Sakai

    Digest of Papers - Microprocesses and Nanotechnology 2007; 20th International Microprocesses and Nanotechnology Conference, MNC   150 - 151   2007

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    DOI: 10.1109/IMNC.2007.4456148

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  • Schottky metal library for ZNO-based UV photodiode fabricated by the combinatorial ion beam-assisted deposition Reviewed

    T. Nagata, P. Ahmet, Y. Z. Yoo, K. Yamada, K. Tsutsui, Y. Wada, T. Chikyow

    Applied Surface Science   252 ( 7 )   2503 - 2506   2006.1

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    DOI: 10.1016/j.apsusc.2005.05.085

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  • Composition spread metal thin film fabrication technique based on ion beam sputter deposition Reviewed

    P Ahmet, T Nagata, D Kukuruznyak, S Yagyu, Y Wakayama, M Yoshitake, T Chikyow

    APPLIED SURFACE SCIENCE   252 ( 7 )   2472 - 2476   2006.1

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    DOI: 10.1016/j.apsusc.2005.05.078

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  • Three-dimensional GaN nano-structure fabrication by focused ion beam chemical vapor deposition Reviewed

    T. Nagata, P. Ahmet, Y. Yamauchi, Y. Sakuma, T. Sekiguchi, T. Chikyow

    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms   242 ( 1-2 )   250 - 252   2006.1

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    DOI: 10.1016/j.nimb.2005.08.130

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  • Combinatorial fabrication and phase diagramming of ternary composition spreads

    Parhat Ahmet, Takahiro Nagata, Dmitry Anatolyevich Kukuruznyak, Kenji Ohmori, Kuniyuki Kakushima, Kazuo Tsutsui, Toyohiro Chikyow, Hiroshi Iwai

    Proceedings - Electrochemical Society   PV 2006-03   215 - 224   2006

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  • Combinatorial fabrication and characterization of oxide and metal thin film composition spreads

    Parhat Ahmet, Takahiro Nagata, Dmitry Anatolyevich Kukuruznyak, Kenji Ohmori, Kuniyuki Kakushima, Kazuo Tsutsui, Toyohiro Chikyow, Hiroshi Iwai

    ECS Transactions   2 ( 1 )   79 - 90   2006

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  • Electro-optical effect in ZnO:Mn thin films prepared by Xe sputtering Reviewed

    Atsushi Ashida, Takahiro Nagata, Norifumi Fujimura

    Journal of Applied Physics   99 ( 1 )   2006

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    DOI: 10.1063/1.2150596

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  • Effects of single-crystalline GaN target on GaN thin films in pulsed laser deposition process Reviewed

    T Nagata, YZ Yoo, P Ahmet, T Chikyow

    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS   44 ( 11 )   7896 - 7900   2005.11

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    DOI: 10.1143/JJAP.44.7896

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  • Low-temperature growth of GaN microcrystals from position-controlled Ga droplets arrayed by a low-energy focused ion beam system Reviewed

    T. Nagata, P. Ahmet, T. Sekiguchi, T. Chikyow

    Journal of Crystal Growth   283 ( 3-4 )   328 - 331   2005.10

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    DOI: 10.1016/j.jcrysgro.2005.06.010

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  • GaN nanostructure fabrication by focused-ion-beam-assisted chemical vapor deposition Reviewed

    T Nagata, P Ahmet, Y Sakuma, T Sekiguchi, T Chikyow

    APPLIED PHYSICS LETTERS   87 ( 1 )   2005.7

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    DOI: 10.1063/1.1968435

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  • Electro-optic effect in ZnO:Mn thin films Reviewed

    T. Nagata, A. Ashida, N. Fujimura, T. Ito

    Journal of Alloys and Compounds   371 ( 1-2 )   157 - 159   2004.5

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    DOI: 10.1016/j.jallcom.2003.06.016

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  • The effects of Xe on an rf plasma and growth of ZnO films by rf sputtering Reviewed

    T. Nagata, A. Ashida, N. Fujimura, T. Ito

    Journal of Applied Physics   95 ( 8 )   3923 - 3927   2004.4

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    DOI: 10.1063/1.1682682

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  • Optical propagation loss of ZnO films grown on sapphire Reviewed

    A. Ashida, H. Ohta, T. Nagata, Y. Nakano, N. Fujimura, T. Ito

    Journal of Applied Physics   95 ( 4 )   1673 - 1676   2004.2

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    DOI: 10.1063/1.1639143

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  • Position controlled GaN nano-structures fabricated by low energy focused ion beam system

    Takahiro Nagata, Parhat Ahmet, Takashi Koida, Shigefusa F. Chichibu, Toyohiro Chikyow

    Materials Research Society Symposium - Proceedings   792   605 - 609   2003

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    DOI: 10.1557/proc-792-r9.39

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  • Electro-optic effect in epitaxial ZnO:Mn thin films Reviewed

    Takahiro Nagata, Atsushi Ashida, Norifumi Fujimura, Taichiro Ito

    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers   41 ( 11 B )   6916 - 6918   2002.11

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    DOI: 10.1143/JJAP.41.6916

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  • Electro-optic property of ZnO:X (X = Li,Mg) thin films Reviewed

    Takahiro Nagata, Tamaki Shimura, Atsushi Ashida, Norifumi Fujimura, Taichiro Ito

    Journal of Crystal Growth   237-239 ( 1-4 I )   533 - 537   2002.4

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    DOI: 10.1016/S0022-0248(01)01957-1

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  • Ferroelectricity in Li-Doped ZnO:X Thin Films and their Application in Optical Switching Devices

    Takahiro Nagata, Tamaki Shimura, Yoshiyuki Nakano, Atsushi Ashida, Norifumi Fujimura, Taichiro Ito

    Japanese Journal of Applied Physics   40 ( Part 1, No. 9B )   5615 - 5618   2001.9

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    DOI: 10.1143/jjap.40.5615

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  • 太陽電池用CuInSe<sub>2</sub>薄膜の機能傾斜化

    芦田淳, 長田貴弘, 熊谷倫一, 伊藤太一郎

    傾斜機能材料論文集   1999   155 - 158   2000.12

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  • Oriented growth of CuInSe2 thin films by means of Cu2Se interfaces

    A. Ashida, T. Nagata, T. Ito

    Materials Science Forum   308-311   301 - 306   1999

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Books

  • Single Crystals of Electronic Materials -Growth and Properties-

    edited by Robert Fornari( Role: ContributorIndium Oxide: In2O3)

    ELSEVIER  2018.12  ( ISBN:9780081020975

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    Responsible for pages:523-546   Language:English   Book type:Scholarly book

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  • PEDOTの材料物性とデバイス応用

    奥崎秀典( Role: Contributor4章 電気特性改善と各種影響因子第4節 UV-オゾンクリーニングのPEDOT/PSS薄膜の電気特性への影響)

    サイエンス&テクノロジー刊  2012.3  ( ISBN:9784864280389

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MISC

  • Nitrogen doping into β-Ga<sub>2</sub>O<sub>3</sub> by RF Nitrogen plasma irradiations

    阿多翔大, 市川龍斗, 古川勝裕, 相馬永, 吉村武, 長田貴弘, 山下良之, 小畠雅明, 福田竜生, 藤村紀文

    応用物理学会学術講演会講演予稿集(CD-ROM)   72nd   2025

  • Development of MoS<sub>2</sub> Biosensor for Measurement of DMF Concentration in Culture Fluid

    福井暁人, 長田貴弘, 土方優, PIRILLO Jenny, 吉村武, 芦田淳, 藤村紀文, 桐谷乃輔

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   81st   2020

  • InGaNの表面‐バルク電子状態評価

    井村将隆, 津田俊輔, 長田貴弘, 山下良之, 吉川英樹, 小林啓介, 小出康夫, 太田優一, 村田秀信, 山口智広, 金子昌充, 荒木努, 名西やすし

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   80th   ROMBUNNO.18a‐PB3‐23   2019.9

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  • Mgドーピングによる高In組成InGaNの表面‐バルク電子状態変化

    井村将隆, 津田俊輔, 長田貴弘, 山下良之, 吉川英樹, 小林啓介, 小出康夫, 山口智広, 山口智広, 金子昌充, 上松尚, 荒木努, 名西やすし

    応用物理学会春季学術講演会講演予稿集(CD-ROM)   65th   ROMBUNNO.17p‐E202‐19   2018.3

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  • 硬X線光電子分光法によるIn<sub>2</sub>O<sub>3</sub>単結晶の電子状態評価

    長田貴弘, BIERWAGEN O, GALAZKA Z, 上田茂典, 吉川英樹, 井村将隆, 山下良之, OH S, 坂田修身, 知京豊裕

    応用物理学会秋季学術講演会講演予稿集(CD-ROM)   75th   ROMBUNNO.17P-PA5-14   2014.9

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  • Suppression of GeO_x with rutile TiO_2 Interlayer between HfO_2 and Ge

    Kobashi Kazuyoshi, Nagata Takahiro, Nabatame Toshihide, Yamashita Yoshiyuki, Ogura Atsushi, Chikyow Toyohiro

    Technical report of IEICE. SDM   113 ( 87 )   25 - 28   2013.6

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    Language:Japanese   Publisher:The Institute of Electronics, Information and Communication Engineers  

    As a alternative of Si channel, the Ge channel has been proposed and has attracted much attention because of high electron and hole mobility. However, the critical problem of Ge MOS devices is high defect densities at the interface of high-k/Ge structures. To overcome this problem, we investigated rutile TiO_2 interlayer as a passivation layer. We fabricated rutile TiO_2 interlayer between HfO_2 and Ge, and found that the GeO_x formation was effectively suppressed. Moreover the good electrical properties with EOT=0.84 nm and small hysteresis were realized. These procedures would be one of the promising method for Ge MOS device.

    CiNii Research

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  • 極性ZnO基板上におけるペンタセン薄膜の成長モード

    中村立, 長田貴弘, 早川竜馬, OH S. J, 廣芝伸哉, 藤村紀文, 知京豊裕, 若山裕, 若山裕

    応用物理学会春季学術講演会講演予稿集(CD-ROM)   60th   ROMBUNNO.28P-G19-8   2013.3

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  • 低温CVD成膜されたSiO<sub>2</sub>における水素ラジカル処理の効果

    土屋佑樹, 池野成裕, 山口拓也, 鈴木摂, 石橋啓司, 長田貴弘, 新船幸二, 吉田晴彦, 佐藤真一, 知京豊裕, 小椋厚志

    応用物理学会学術講演会講演予稿集(CD-ROM)   73rd   ROMBUNNO.12A-F6-5   2012.8

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  • 極性を有するZnO基板上のペンタセン薄膜の成長過程

    中村立, 長田貴弘, 早川竜馬, OH S. J, 廣芝伸哉, 藤村紀文, 知京豊裕, 若山裕

    応用物理学会学術講演会講演予稿集(CD−ROM)   72nd   ROMBUNNO.31A-ZQ-6   2011.8

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  • Zn極性及びO極性ホモエピタキシャルZnO薄膜の表面構造

    中村立, 長田貴弘, 芦田淳, 吉村武, 藤村紀文

    応用物理学関係連合講演会講演予稿集(CD-ROM)   58th   2011

  • 金属酸化物を用いた原子スイッチ中間層材料の検討 ([日本電子材料技術協会]第44回秋期講演大会--優秀賞受賞論文と受賞者の感想)

    南風盛 将光, 長田 貴弘, 知京 豊裕

    日本電子材料技術協会会報   39   28 - 30   2008.11

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  • 連続発振レーザーMBEによる有機分子組成傾斜薄膜の作製

    柳沼誠一郎, 伊高健治, 松本祐司, 大西剛, LIPPMAA Mikk, 長田貴弘, 知京豊裕, 鯉沼秀臣

    応用物理学関係連合講演会講演予稿集   54th ( 3 )   1289   2007.3

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Presentations

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Industrial property rights

  • 誘電体膜およびそれを用いたキャパシタならびに誘電体膜の製造方法

    長田 貴弘, 知京 豊裕, 安藤 陽, 池田 潤

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    Applicant:国立研究開発法人物質・材料研究機構, 株式会社村田製作所

    Application no:特願2021-090488  Date applied:2021.5

    Announcement no:特開2022-182764  Date announced:2022.12

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  • 画像処理方法、画像処理装置、X線回折装置およびプログラム

    山下 晶洸, 朝日 透, 長田 貴弘, 柳生 進二郎, 知京 豊裕

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    Applicant:国立研究開発法人物質・材料研究機構, 学校法人早稲田大学

    Application no:特願2020-182859  Date applied:2020.10

    Announcement no:特開2022-073083  Date announced:2022.5

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  • 積層膜構造体及びその製造方法

    土田 裕也, 末本 祐也, 上岡 義弘, 召田 雅実, 倉持 豪人, 長田 貴弘, サン リウエン, 知京 豊裕

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    Applicant:東ソー株式会社, 国立研究開発法人物質・材料研究機構

    Application no:特願2020-140980  Date applied:2020.8

    Announcement no:特開2021-075779  Date announced:2021.5

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  • 磁化測定装置、測定システム及びその測定方法

    柳生 進二郎, 三井 正, 長田 貴弘, 知京 豊裕

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2020-139027  Date applied:2020.8

    Announcement no:特開2021-039101  Date announced:2021.3

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  • 誘電体膜およびそれを用いたキャパシタならびに誘電体膜の製造方法

    長田 貴弘, 知京 豊裕, 安藤 陽

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    Applicant:国立研究開発法人物質・材料研究機構, 株式会社村田製作所

    Application no:JP2020021128  Date applied:2020.5

    Patent/Registration no:特許第7226747号  Date registered:2023.2 

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  • MIS型半導体装置およびその製造方法、並びにその製造に用いるスパッタリングターゲット

    長田 貴弘, 知京 豊裕

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:JP2018046719  Date applied:2018.12

    Publication no:WO2019-142581  Date published:2019.7

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  • MIS型半導体装置およびその製造方法、並びにその製造に用いるスパッタリングターゲット

    長田 貴弘, 知京 豊裕

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2019-565774  Date applied:2018.12

    Patent/Registration no:特許第6846834号  Date registered:2021.3 

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  • MIS型半導体装置およびその製造方法

    長田 貴弘, 知京 豊裕

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    Application no:特願2017-093745  Date applied:2017.5

    Announcement no:特開2018-190876  Date announced:2018.11

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  • MIS型半導体装置およびその製造方法

    長田 貴弘, 知京 豊裕

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2017-093745  Date applied:2017.5

    Announcement no:特開2018-190876  Date announced:2018.11

    Patent/Registration no:特許第6955748号  Date registered:2021.10 

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  • MIS型半導体装置およびその製造方法

    長田 貴弘, 知京 豊裕

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2017-079420  Date applied:2017.4

    Announcement no:特開2018-182058  Date announced:2018.11

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  • MIS型半導体装置およびその製造方法

    長田 貴弘, 知京 豊裕

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2017-079420  Date applied:2017.4

    Announcement no:特開2018-182058  Date announced:2018.11

    Patent/Registration no:特許第6941346号  Date registered:2021.9 

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  • プロトン伝導体および燃料電池

    嘉副 裕, ピホシュ ユーリ, 馬渡 和真, 北森 武彦, 北村 健二, 長田 貴弘, 田畑 修, 土屋 智由

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    Applicant:国立研究開発法人科学技術振興機構, 国立研究開発法人物質・材料研究機構

    Application no:特願2015-207235  Date applied:2015.10

    Announcement no:特開2016-085967  Date announced:2016.5

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  • プロトン伝導体および燃料電池

    嘉副 裕, ピホシュ ユーリ, 馬渡 和真, 北森 武彦, 北村 健二, 長田 貴弘, 田畑 修, 土屋 智由

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    Applicant:国立研究開発法人科学技術振興機構, 国立研究開発法人物質・材料研究機構

    Application no:特願2015-207235  Date applied:2015.10

    Announcement no:特開2016-085967  Date announced:2016.5

    Patent/Registration no:特許第6598013号  Date registered:2019.10 

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  • ビスマス系誘電体用電極及びキャパシタ

    長田 貴弘, ソム, クマラグルバラン, 知京 豊裕, 高橋 健一郎, 李 成奇, 鈴木 摂, 恒川 吉文

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2015-044135  Date applied:2015.3

    Announcement no:特開2016-164901  Date announced:2016.9

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  • ビスマス系誘電体用電極及びキャパシタ

    長田 貴弘, ソム クマラグルバラン, 知京 豊裕, 高橋 健一郎, 李 成奇, 鈴木 摂, 恒川 吉文

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2015-044135  Date applied:2015.3

    Announcement no:特開2016-164901  Date announced:2016.9

    Patent/Registration no:特許第6887655号  Date registered:2021.5 

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  • 強誘電体キャパシタおよび電子デバイス

    長田 貴弘, 北村 健二

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2014-183094  Date applied:2014.9

    Announcement no:特開2016-058516  Date announced:2016.4

    Patent/Registration no:特許6425334  Date issued:2018.11

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  • 強誘電体キャパシタおよび電子デバイス

    長田 貴弘, 北村 健二

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2014-183184  Date applied:2014.9

    Announcement no:特開2016-058523  Date announced:2016.4

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  • 強誘電体キャパシタおよび電子デバイス

    長田 貴弘, 北村 健二

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2014-183094  Date applied:2014.9

    Announcement no:特開2016-058516  Date announced:2016.4

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  • 強誘電体キャパシタおよび電子デバイス

    長田 貴弘, 北村 健二

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2014-183184  Date applied:2014.9

    Announcement no:特開2016-058523  Date announced:2016.4

    Patent/Registration no:特許6371171  Date issued:2018.7

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  • 誘電体薄膜

    長田 貴弘, ソム, クマラグルバラン, 知京 豊裕, 高橋 健一郎, 李 成奇, 鈴木 摂, 恒川 吉文

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2014-171406  Date applied:2014.8

    Announcement no:特開2016-044350  Date announced:2016.4

    Patent/Registration no:特許第6308554号  Date registered:2018.3  Date issued:2018.3

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  • 誘電体薄膜

    長田 貴弘, ソム, クマラグルバラン, 知京 豊裕, 高橋 健一郎, 李 成奇, 鈴木 摂, 恒川 吉文

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    Applicant:国立研究開発法人物質・材料研究機構

    Application no:特願2014-171406  Date applied:2014.8

    Announcement no:特開2016-044350  Date announced:2016.4

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  • 表面増強ラマン分光分析用(SERS)基板、その製造方法、それを用いたバイオセンサおよびそれを用いたマイクロ流路デバイス

    北村 健二, 長田 実, 長田 貴弘, 劉 暁燕, グヲツォンツァオ

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    Applicant:国立研究開発法人物質・材料研究機構, ワシントン大学

    Application no:特願2013-135565  Date applied:2013.6

    Announcement no:特開2014-010154  Date announced:2014.1

    Patent/Registration no:特許第6146898号  Date registered:2017.5  Date issued:2017.5

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  • 表面増強ラマン分光分析用(SERS)基板、その製造方法、それを用いたバイオセンサおよびそれを用いたマイクロ流路デバイス

    北村 健二, 長田 実, 長田 貴弘, 劉 暁燕, グヲツォンツァオ

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    Applicant:独立行政法人物質・材料研究機構, ワシントン大学

    Application no:特願2013-135565  Date applied:2013.6

    Announcement no:特開2014-010154  Date announced:2014.1

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  • sp3−結合性BN高密度相を有するBN薄膜およびその製造方法。

    小松 正二郎, 知京 豊裕, 佐藤 裕平, 平野 大輔, 長田 貴弘

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    Applicant:独立行政法人物質・材料研究機構

    Application no:特願2008-186594  Date applied:2008.7

    Announcement no:特開2009-256766  Date announced:2009.11

    Patent/Registration no:特許第5218969号  Date issued:2013.3

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  • 多元化合物作製装置

    長田 貴弘, 知京 豊裕, 南風盛 将光

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    Applicant:独立行政法人物質・材料研究機構

    Application no:特願2008-139667  Date applied:2008.5

    Announcement no:特開2009-287069  Date announced:2009.12

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  • 窒化ガリウム等のIII族窒化物の成膜方法

    長田 貴弘, 知京 豊裕, 上原 剛, 安西 純一郎

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    Applicant:積水化学工業株式会社, 独立行政法人物質・材料研究機構

    Application no:特願2008-047384  Date applied:2008.2

    Announcement no:特開2008-255471  Date announced:2008.10

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  • 窒化ガリウム等のIII族窒化物の成膜方法

    長田 貴弘, 知京 豊裕, 上原 剛, 安西 純一郎

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    Applicant:積水化学工業株式会社, 独立行政法人物質・材料研究機構

    Application no:特願2008-047384  Date applied:2008.2

    Announcement no:特開2008-255471  Date announced:2008.10

    Patent/Registration no:特許第5044860号  Date issued:2012.7

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  • 窒化ガリウム等のIII族窒化物の成膜方法

    長田 貴弘, 知京 豊裕, 上原 剛

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    Applicant:独立行政法人物質・材料研究機構, 積水化学工業株式会社

    Application no:JP2006315404  Date applied:2006.8

    Announcement no:WO2007-018121  Date announced:2007.2

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Awards

  • The 74th JSPS Autumn Meeting, 2013, Poster Award

    2013.10   The 74th JSPS Autumn Meeting, 2013, Poster Award   Anisotropic growth of ZnO nanorods and their electrical properties

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  • Outstanding Poster Award (2011)

    2011.12   Materials Research Society   Oxygen migration at Pt or Cu/HfO2 interface under bias operation: oxide based ReRAM application

    Takahiro Nagata

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  • 第43回日本電子材料技術協会秋期講演大会優秀発表賞

    2005.10   日本電子材料技術協会   集束イオンビームCVD法によるGaN立体構造の作製と評価

    長田貴弘

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Research Projects

  • Understanding and controlling parasitic resistance in atomic layer devices by data-driven multi-dimensional spectromicroscopy

    Grant number:25K01628  2025.4 - 2028.3

    Japan Society for the Promotion of Science  Grants-in-Aid for Scientific Research  Grant-in-Aid for Scientific Research (B)

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    Grant amount:\18850000 ( Direct Cost: \14500000 、 Indirect Cost:\4350000 )

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  • Development of fluoride based high-k dielectric thin film materials for MIS structure

    Grant number:20H02188  2020.4 - 2023.3

    Japan Society for the Promotion of Science  Grants-in-Aid for Scientific Research Grant-in-Aid for Scientific Research (B)  Grant-in-Aid for Scientific Research (B)

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    Grant amount:\16250000 ( Direct Cost: \12500000 、 Indirect Cost:\3750000 )

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  • Study on electrical property control of pi- conjugated material by pyroelectricity and surface screening charge of polar material for environmental sensor applications

    Grant number:16K06284  2016.4 - 2019.3

    JSPS  KAKENHI  Grant-in-Aid for Scientific Research (C)

    Takahiro Nagata

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    Authorship:Principal investigator  Grant type:Competitive

    We investigated the effect of the pyroelectricity of LiNbO3 on the LiNbO3/graphene interface for the sensor application. With decreasing temperature, the resistivity increases by 2 to 3 digit and nonlinear current-voltage properties were confirmed at the single- and two-layer graphene, which is consistent with the tendency of the negative pyroelectric coefficient (-0.008 μC/Kcm2) of LiNbO3. Kelvin force microscope suggested that the electrical properties of the single-layer graphene was affected by the screen charge generated by the polarization of LiNbO3. For the three-layer graphene, the career scattering owing to the surface roughness increased the resistivity at the low temperature. The polarization and pyroelectricity of LiNbO3 has a potential for the electrical property control of graphene.

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  • フッ化物ユニバーサル高誘電体極薄膜材料の創出

    2014.10 - 2018.3

    科学技術振興機構  戦略的創造研究推進事業 さきがけ [素材・デバイス・システム融合による革新的ナノエレクトロニクスの創成] 

    長田貴弘

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    Authorship:Principal investigator  Grant type:Competitive

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  • 強誘電体分極・表面電荷を用いたπ電子材料の機能制御と電界効果素子の開発

    2014.7 - 2015.6

    公益財団法人村田学術振興財団  平成27年度研究助成 

    長田貴弘

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    Authorship:Principal investigator  Grant type:Competitive

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  • Fundamental study of polarity and screening charge effects of ferroelectric materials on pi conjugated materials for autonomous operational sensor application

    Grant number:26630138  2014.4 - 2016.3

    JSPS  KAKENHI  Grant-in-Aid for Challenging Exploratory Research

    Takahiro Nagata

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    Authorship:Principal investigator  Grant type:Competitive

    Ferroelectric materials exhibit spontaneous polarization and surface screening charge without the application of an electric field due to a lack of inversion symmetry and ionic bonds. In this research, we demonstrated the resistivity control of π conjugated materials on a ferroelectric material: LiNbO3 (LN) by the spontaneous polarization and pyroelectricity, which can be applied to sensor applications. We also demonstrated the screening charge localization by using a Schottky contact with LN, suggesting that the LN surface harvests electric energy from the environment. By combining these results, we found the possibility of a new sensor device that can be operated autonomously without external electrical source.

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  • Interface structure and hydrogen detection of Schottky contact to polar-ZnO single crystal

    Grant number:19760224  2007.4 - 2009.3

    Japan Society for the Promotion of Science  Grants-in-Aid for Scientific Research Grant-in-Aid for Young Scientists (B)  Grant-in-Aid for Young Scientists (B)

    NAGATA Takahiro, CHIKYOW Toyohiro

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    Authorship:Principal investigator  Grant type:Competitive

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  • エキゾティックドーピングを用いたZnOモノリシック光導波路の基礎検討

    2002.4 - 2003.3

    財団法人日本科学協会  平成14年度笹川科学研究助成 

    長田貴弘

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    Authorship:Principal investigator  Grant type:Competitive

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Teaching Experience

  • 真空・ナノ薄膜工学

    Institution:千葉大学

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